A Learning-Based Framework for Circuit Path Level NBTI Degradation Prediction
نویسندگان
چکیده
منابع مشابه
Circuit performance degradation on FPGAs considering NBTI and process variations
LSI scaling causes the reliability problem. It is important to analyze the degradation of Negative Bias Temperature Instability(NBTI) in circuit designs. Yield is affected by variations. In the near future, NBTI and variations will decrease reliability on FPGAs fabricated in a nanometer process. In this work, we show the effect of NBTI and variations on 65nm FPGAs. According to our results, cic...
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ژورنال
عنوان ژورنال: Electronics
سال: 2020
ISSN: 2079-9292
DOI: 10.3390/electronics9111976